A method to simulate the optical image from far-field scattering numerical data and its application to the total internal reflection microscopy of metallic nanowires

摘要

Computational electrodynamics modelling plays an important role in understanding and designing new photonic devices. The results offered by these simulations are usually close-range field distributions or angular power emission plots. We describe a procedure to compute the optical microscopy image from simulated far-field scattering data using three-dimensional discrete Fourier transforms that can be used when the simulation software package do not include proper far-field to optical imaging projection routines. The method is demonstrated comparing simulated images with real images of nanowires obtained with a total internal reflection microscope.