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首页> 外文期刊>Journal of near infrared spectroscopy >Near infrared spectroscopy as an alternative method for rapid evaluation of toluene swell of natural rubber latex and its products
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Near infrared spectroscopy as an alternative method for rapid evaluation of toluene swell of natural rubber latex and its products

机译:近红外光谱作为替代方法,用于快速评价天然橡胶乳胶及其产品的甲苯肿胀

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摘要

Toluene swell or equilibrium swelling is universally used by rubber factories to measure the degree of crosslink of their compounded or prevulcanized latices at different stages of production. To apply near infrared spectroscopy for rapid and accurate quality control, spectral acquisition of prevulcanized latex, thin film and thick film was performed using a Fourier transform near infrared spectrometer in diffuse reflection mode across the wavenumber range of 12,500-3600 cm(-1). For prevulcanized latex an effective model was developed using partial least squares regression with preprocessing (first derivative + straight line subtraction method). The coefficient of determination (r(2)), root mean square error of cross validation and bias of the validation set were 0.71, 3.93% and -0.005%, respectively. For the thin film model the r(2), root mean square error of cross validation and bias were 0.65, 4.01% and -0.028%, respectively. Whereas for the thick film model the r(2), root mean square error of cross validation and bias were 0.70, 4.00% and -0.006%, respectively. Three models including prevulcanized latex, thin film and thick film were validated by 23 unknown samples, providing standard error of prediction and bias of 5.357 and 2.494, 4.565 and 1.001 and 3.641 and -0.961%, respectively, for prevulcanized latex, thin film and thick film. The model developed for the thick film spectra gave the best results.
机译:甲苯膨胀或均衡肿胀普遍用橡胶工厂使用,以测量其复合或预硫化胶乳的交联程度在不同的生产阶段。为了施加近红外光谱,进行快速准确的质量控制,使用傅立叶变换在12,500-3600cm(-1)的漫反射模式下,在红外光谱仪中使用傅里叶变换进行耐磷酸锌,薄膜和厚膜的光谱采集。对于预硫化的乳胶,使用与预处理(第一衍生+直线减法法)的部分最小二乘回归进行有效模型。测定系数(R(2)),交叉验证的根均方误差和验证组的偏置分别为0.71,3.93%和-0.005%。对于薄膜模型,R(2),交叉验证的根均方误差分别为0.65,4.01%和-0.028%。虽然对于厚膜模型,R(2),交叉验证的根均方误差分别为0.70,4.00%和-0.006%。通过23个未知样品验证包括预硫化胶乳,薄膜和厚膜的三种型号,可分别提供预测的标准误差和5.357和2.494,4.565和1.001和3.641和-0.961%的偏置误差,用于预硫化乳胶,薄膜和厚度电影。为厚膜光谱开发的模型提供了最佳效果。

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