首页> 外文期刊>Journal of Materials Chemistry, C. materials for optical and electronic devices >Redox-active Eu(2)O(3)nanoflakes as a buffer layer for inverted CsPbI2Br perovskite solar cells with enhanced performance
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Redox-active Eu(2)O(3)nanoflakes as a buffer layer for inverted CsPbI2Br perovskite solar cells with enhanced performance

机译:氧化还原活性EU(2)O(3)纳米薄片作为倒CSPBI2BR Perovskite太阳能电池的缓冲层,具有增强的性能

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Solution processed CsPbX(3)films usually present a high content of Pb(0)clusters, acting as significant defects on the perovskite surface. Conventional electron transport materials, including PC61BM, TiO2, ZnO, SnO(2)and Nb2O5, can hardly passivate these defects. In this work, few-layered Eu(2)O(3)nanoflakes (nano-Eu2O3) are prepared, which exhibit much higher redox activity towards Pb-0/I(0)than the commercial Eu(2)O(3)powder. When nano-Eu(2)O(3)is introduced as the buffer layer between the CsPbI2Br and PC61BM layers in inverted perovskite solar cells (PeSC), the devices deliver remarkably improved photovoltaic performance with an average power conversion efficiency (PCE) of 13.47% and a champion PCE of 14.09%, which is much superior to the control devices without nano-Eu2O3(9.74/11.03%). A series of mechanism studies reveal that the addition of nano-Eu(2)O(3)buffer layer enables not only more efficient hole-blocking but also remarkably enhanced defect passivation at the perovskite/PC61BM interface, both of which result in significantly reduced interfacial charge recombination. Besides, we show that the devices with nano-Eu(2)O(3)exhibit obviously improved thermal stability with >90% PCE remaining after 400 h of thermal aging at 80 degrees C.
机译:溶液加工CSPBX(3)膜通常呈现高含量的Pb(0)簇,作用于钙钛矿表面的显着缺陷。常规电子传输材料,包括PC61BM,TiO2,ZnO,SnO(2)和NB2O5,可能几乎不能钝化这些缺陷。在这项工作中,制备少数层EU(2)O(3)纳米薄蛋白(3)纳米薄蛋白(纳米-EU2O3),其比商业EU(2)O(3)表现出朝向Pb-0 / I(0)的更高氧化还原活性粉末。当纳米 - 欧盟(2)O(3)作为倒钙钛矿太阳能电池(PESC)之间的CSPBI2BR和PC61BM层之间的缓冲层引入时,该器件具有显着改善的光伏性能,具有13.47的平均功率转换效率(PCE)的光伏性能显着提高了光伏性能%和14.09%的冠军PCE,它与无纳米EU2O3的控制装置高出(9.74 / 11.03%)。一系列机制研究表明,添加纳米EU(2)O(3)缓冲层,不仅可以更有效的空穴阻塞,而且在PEROVSKITE / PC61BM界面中也显着增强了缺陷钝化,这两者都会显着降低界面电荷重组。此外,我们表明,具有纳米EU(2)O(3)的装置显然提高了热稳定性,在80摄氏度下热老化400小时后留下了> 90%PCE。

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