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Measurements of charging-up processes in THGEM-based particle detectors

机译:基于THGEM的粒子探测器中充电过程的测量

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摘要

The time-dependent gain variation of detectors incorporating Thick Gas Electron Multipliers (THGEM) electrodes was studied in the context of charging-up processes of the electrode's insulating surfaces. An experimental study was performed to examine model-simulation results of the aforementioned phenomena, under various experimental conditions. The results indicate that in a stable detector's environment, the gain stabilization process is mainly affected by the charging-up of the detector's insulating surfaces caused by the avalanche charges. The charging-up is a transient effect, occurring during the detector's initial operation period; it does not affect its long-term operation. The experimental results are consistent with the outcome of model-simulations.
机译:在电极绝缘表面的充电过程的背景下研究了包含厚气体乘法器(THGEM)电极的探测器的时间依赖性增益变化。 在各种实验条件下,进行实验研究以检查上述现象的模型仿真结果。 结果表明,在稳定的探测器的环境中,增益稳定过程主要受到由雪崩费用引起的探测器绝缘表面的充电的影响。 充电是在探测器的初始操作期间发生的瞬态效果; 它不会影响其长期操作。 实验结果与模型模拟的结果一致。

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