...
首页> 外文期刊>Journal of Electronic Testing: Theory and Applications: Theory and Applications >Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas
【24h】

Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas

机译:无效集成RF相位阵列天线的接触近场测试

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Future RF transceivers are expected to integrate the entire system, from baseband to antenna. Many emerging applications use beam forming, which necessitates RF phased arrays and multiple antennas integrated on the same die. This integration presents a challenge in testing the entire system including antennas. The electromagnetic signal output is combined in the air and no longer can be separated by physically connecting to the test equipment. Testing each element in isolation does not exercise the interaction between the elements and cannot characterize important parameters such as phase mismatch. Thus, systems with multiple integrated antennas need to be tested using wireless means. This paper presents a novel contact-less near-field test method for measuring the gain and phase mismatch of RF phased array antennas. The proposed method is based on using a known good die (KGD) receiver phased array antenna to capture the combined EM output of the transmitter antenna as the device under test (DUT). The mathematical model of mutual impedances and signal propagation is presented for a 16-element phased array to determine both gain and phase mismatches. The feasibility of the method is shown using hardware measurement. The accuracy of the method under process variations and imperfections in the test set-up, including noise and error in test set-up dimensions, is further investigated through electromagnetic (EM) simulations of a coplanar patch antenna array of sixteen elements.
机译:预计未来的RF收发机将从基带到天线集成整个系统。许多新兴应用使用光束形成,这需要RF相位阵列和集成在同一管芯上的多个天线。这种集成在测试包括天线的整个系统时提出挑战。电磁信号输出在空气中组合,通过物理连接到测试设备不再可以分离。在隔离中测试每个元素不锻炼元素之间的交互,并且不能表征诸如相位错配的重要参数。因此,需要使用无线装置测试具有多集成天线的系统。本文介绍了一种用于测量RF相位阵列天线的增益和相位失配的新型接触近场测试方法。所提出的方法基于使用已知的良好模具(KGD)接收器相控阵天线,以捕获发射器天线的组合EM输出作为被测器件(DUT)。呈现相互阻抗和信号传播的数学模型,用于16元分元阵列以确定增益和相位不匹配。使用硬件测量显示该方法的可行性。通过十六个元素的共面贴片天线阵列的电磁(EM)模拟进一步研究了测试设置中的过程变化和测试设置中的缺陷的方法的准确性,包括测试设置尺寸的噪声和误差。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号