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Development of an AES based analytical method for the determination of trace metallic impurities in uranium silicide dispersion fuel: from precursors to end products

机译:基于AES基于AES的分析方法测定硅化物分散燃料中痕量金属杂质:从前体到终端产物

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摘要

An analytical method was developed based on the D.C. arc carrier distillation atomic emission spectrometric (D.C. Arc AES) technique for determination of trace metallic impurities (Al, Ca, Co, Cr, Cu, Fe, Mg, Mn, Mo, Na, Ni, Si, Sn, Ti, V and Zn) in uranium silicide samples. Chemical quality control was also carried out for the precursor materials in order to track the source of impurities in the final fuel materials. The method was validated using synthetic samples. To minimize the spectral interference, a suitable carrier (5% AgCl) was used to sweep away the trace constituents into the arc preferentially, leaving the major matrix as a refractory material. The use of a charge coupled device (CCD) detector was found to improve the overall analytical performance in terms of detection limits, precision, linear dynamic range and most importantly providing an opportunity to choose additional analytical lines, which is highly desirable, especially for trace level determination of analytes in an emission-rich matrix. The energy dispersive X-ray fluorescence (EDXRF) spectroscopic technique was employed each time for comparative evaluation of the precursors and the product.
机译:基于DC弧载蒸馏原子发射光谱(DC ARC ARC A)技术开发了一种分析方法,用于测定痕量金属杂质(Al,Ca,Co,Cr,Cu,Fe,Mg,Mn,Mo,Na,Ni, Si,Sn,Ti,V和Zn)在硅化铀样品中。前体材料还对化学质量控制进行了追踪最终燃料材料中的杂质来源。使用合成样品验证该方法。为了最小化光谱干扰,使用合适的载体(5%AgCl)优先地将痕量成分扫除到电弧中,使主基质作为耐火材料。发现电荷耦合器件(CCD)检测器的使用在检测限度,精度,线性动态范围方面提高了整体分析性能,以及最重要的是提供一种选择额外的分析线的机会,这是非常理想的,特别是对于痕迹水平测定富含排放的基质中的分析物。每次采用能量分散X射线荧光(EDXRF)光谱技术进行前体和产品的比较评价。

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