首页> 外文期刊>X-Ray Spectrometry: An International Journal >Measurements of elastic scattering cross sections for 25.2, 28.5, 37.4, 36.8, and 42.2keV X-ray photons in elements with 22 = Z = 83
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Measurements of elastic scattering cross sections for 25.2, 28.5, 37.4, 36.8, and 42.2keV X-ray photons in elements with 22 = Z = 83

机译:25.2,28.5,37.4,36.8和42.2keV X射线光子的弹性散射横截面的测量值,其元素中的22.2℃。= 83

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摘要

The differential elastic scattering cross sections were measured for 25.2 (Sn-K), 28.5 (Sn-K-1,K-3), 37.4 (Nd-K-1), 36.8 (Nd-K-2), and 42.2 (Nd-K-1,K-3) keV X-ray photons at 139 degrees scattering angle in elements with 22Z83. The measurement was done in reflection mode experimental setup involving Sn-50/Nd-60 secondary targets excited with Am-241 radioisotope. The scattered X-ray photons were detected using a high-resolution low energy germanium detector (horizontal configuration, FWHM=300eV at 59.5keV) coupled with computerized multichannel analyzer. The intensity of X-ray photons along with geometrical factors were calculated from the theoretical knowledge of K X-ray fluorescence cross sections and measured K X-ray yields from excited targets. The measured values of differential cross sections were compared with the theoretical available values based on form factor and second-order S-matrix (SM) approaches. The experimental values of cross sections exhibit a large deviation from modified form (MF) values for the elements with B-K/E-in approximate to 1, where B-K is the K-shell binding energy of electrons and E-in is the energy of incident photon. These deviations in experiment results were smooth out by the inclusion of anomalous scattering factors (ASFs) to the MF values. The measured elastic cross sections were found to be similar to 7% lower than MFASF values and agree with SM values for all elements under investigation.
机译:测量差分弹性散射横截面25.2(Sn-K),28.5(Sn-K-1,K-3),37.4(Nd-K-1),36.8(Nd-K-2)和42.2( ND-K-1,K-3)Kev X射线光子以22z83的元件中的139度散射角度。测量在反射模式实验设置中进行,涉及与AM-241放射性同位素激发的Sn-50 / Nd-60次级靶。使用高分辨率低能量锗检测器(水平配置,59.5kev)与计算机化的多通道分析仪一起检测散射的X射线光子。根据K X射线荧光横截面的理论知识计算X射线光子以及几何因子的强度,并测量来自激发靶的K X射线产率。将测量的差分横截面的值与基于形状因子和二阶S矩阵(SM)方法进行比较。横截面的实验值表现出与具有BK / E-近似的元件的改性形式(MF)值的大偏差,其中BK是电子的k-shell结合能量和E-In是事件的能量光子。实验结果中的这些偏差通过将异常的散射因子(ASF)包含到MF值来平滑。发现测量的弹性横截面与MFASF值低的7%相似,并与正在调查的所有元素的SM值同意。

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