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Vis-and NIR-Based Instruments for Detection of Black-Tip Damaged Wheat Kernels: A Comparative Study

机译:基于VIS和NIR的仪器用于检测黑尖损坏的小麦内核:比较研究

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摘要

Black-tip (BT) is a non-mycotoxic fungus that attacks wheat kernels, forming a dark brown or black sooty area at the tip of the kernel. Visual inspection, which is the approved reference method for determining the amount of BT in wheat, requires substantial time and has high potential for subjective evaluation. Three spectrometers covering the spectral ranges 950-1636 nm (Sped), 600-1045 nm (Sped), and 380-780 nm (Spec3) were evaluatedfor their ability to predict the presence ofBT. Kernels were quantified into four levels: (A) sound, (B) low black-tip symptoms (BTS), (C) high BTS, and (D) BT damaged (BTD). Discriminant classification models were developed to evaluate combinations of levels. The combinations were (1) levels A, B, C, and D separately;(2) A, B+C andD; and (3) A +B and C+D. Spectral data for 2,760 kernels obtainedfrom 23 hard red winter (HRW) wheat samples, each comprising 30 kernels that were visually selectedfor each of the four levels of black-tip severity (A, B, C, and D), were collected with each spectrometer. Discriminant calibration models for each spectrometer and classification category were developed based on (I) three combinations of 17 HRW wheat samples, with the six remaining samples usedfor independent validation, and (2) combinations of 20 randomly selected kernels from each of the 23 HRW wheat samples as calibration samples, with the remaining ten kernels used as validation samples. Discriminant analysis was based on five wavelengths for each model. Spectra pretreatment was the standard normal variate (SNV). Results showed that all three spectrometers were capable of detecting BT damage on wheat kernels. BT classification accuracy was observed to have been affected by wheat varieties for Sped and Spec2 (both with NIR wavelengths) but not for Spec3, which was entirely in the visible region. The two-category classification (A+B, C+D) provided higher accuracy than the three-category (A, B+C, D) andfour-category (A, B, C, D) classifications. Based on the percent correct classification and Youden s index, Spec2 performed better in detecting sound and BTD wheat kernels, with classification accuracies of the best two-category classification calibration model ranging from 85.6% to 87.5%, compared to Sped at 74.8% to 78.4%andSpec3 at 76.7% to 79.2%. This study also showed the potential of using a five-wavelength model, which equates to the potential for developing simple, less expensive, high-speed photoelectric detection instruments. These instruments can serve as important tools in plant breeding, grading, or grain processing facilities to enable BT detection and, with proper selection of wavelengths, may also find applications in simultaneous single-kernel detection, measurement, and segregation of other chemical characteristics, such as protein and starch content.
机译:黑尖(BT)是一种非霉菌毒真菌,攻击小麦内核,在内核的尖端形成深棕色或黑色烟区。目视检查,即确定小麦中BT金额的批准参考方法,需要大量的时间并具有高潜力的主观评价。覆盖光谱范围的三个光谱仪950-1636nm(Sped),600-1045nm(Sped)和380-780nm(spec3)进行了预测否定的能力。核量化为四个水平:(a)声音,(b)低黑尖症状(BTS),(c)高BTS,和(d)BT损坏(BTD)。开发了判别分类模型来评估水平的组合。组合是(1)水平A,B,C和D分别;(2)A,B + C ANDD; (3)A + B和C + D.用于2,760粒的光谱数据,用于23硬红色冬季(HRW)小麦样品,每个样品包括在目视选择的每一个黑尖端严重程度(A,B,C和D)中的每个粒细胞,每个光谱仪收集。基于(i)17个HRW小麦样品的三种组合开发了每个光谱仪和分类类别的判别校准模型,其中六个剩余的样品用于独立验证,(2)来自23个HRW小麦中的每一个随机选择的内核的组合样品作为校准样本,剩余的十个内核用作验证样本。判别分析基于每个模型的五个波长。光谱预处理是标准正常变化(SNV)。结果表明,所有三个光谱仪都能够检测小麦核的BT损伤。观察到BT分类准确性受到SPED和SPEC2(含有NIR波长)的小麦品种的影响,但不适用于完全在可见区域的规格3。两个类别分类(A + B,C + D)提供比三类(A,B + C,D)和Four类别(A,B,C,D)分类更高的精度。基于正确的分类百分比和YENDEN S指数,SPEC2在检测声音和BTD小麦内核方面更好地表现,最佳两类分类校准模型的分类精度范围为85.6%至87.5%,与74.8%相比为78.​​4 %ANDSPEC3为76.7%至79.2%。本研究还表明了使用五波长模型的电位,这相当于开发简单,便宜,高速光电检测仪器的可能性。这些仪器可以作为植物育种,分级或谷物加工设施中的重要工具,以使BT检测能够进行BT检测,并且具有正确选择波长,也可以在同时单核检测,测量和其他化学特征的偏析中找到应用,如此作为蛋白质和淀粉含量。

著录项

  • 来源
    《Transactions of the ASABE》 |2018年第2期|共7页
  • 作者单位

    College of Mechanical and Electronic Engineering Northwest A&

    F University Yangling Shaanxi China Key Laboratory of Agricultural Internet of Things Ministry of Agriculture Yangling Shaanxi China and Shaanxi Key Laboratory of Agricultural Informat;

    College of Mechanical and Electronic Engineering Northwest A&

    F University Yangling Shaanxi China Key Laboratory of Agricultural Internet of Things Ministry of Agriculture Yangling Shaanxi China and Shaanxi Key Laboratory of Agricultural Informat;

    Agricultural Engineer USDA-ARS Stored Product Insect and Engineering Research Unit Center for Grain and Animal Health Research Manhattan Kansas;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 农业科学;
  • 关键词

    Black-tip damage; NIR; VIS; Spectroscopy; Wheat.;

    机译:黑尖损伤;NIR;VI;光谱;小麦。;

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