首页> 外文期刊>The European physical journal, D. Atomic, molecular, and optical physics >Size dependence of thermal stability of Pt clusters bound to Si substrate surface prepared by cluster impact deposition
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Size dependence of thermal stability of Pt clusters bound to Si substrate surface prepared by cluster impact deposition

机译:通过簇冲击沉积制备的PT簇的热稳定性的尺寸依赖性

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摘要

Thermal behavior of Pt-10 and Pt-1 bound to a silicon substrate prepared by the impact of size-selected Pt cluster ions at 1 eV per Pt atom was investigated. Their height and diameter were obtained by statistical analysis of their images using scanning-tunneling microscopy. The Pt-10 are stably bound to the Si surface as monatomic-layered Pt10Six disks with insertion of Si atoms into the clusters at the moment of the impact, and they start to be decomposed between 623 and 673 K under vacuum conditions. The thermal stability of the Pt10Six disks is comparable to that of a Pt thin film prepared on a Si substrate, but inferior to that of Pt-30 disks on the Si substrate. Comparing with thermal behavior of Pt atoms and a PtSi thin film on the Si substrate, it has been concluded that more Si atoms start to diffuse into a Pt10Six disk between 623 and 673 K, while they do not into a Pt-30 disk having a close-packed arrangement of the Pt atoms as high as 673 K, owing to a higher barrier for the Si insertion into the close-packed cluster disk than into the Pt10Six disk having a longer Pt-Pt internuclear distance.
机译:研究了Pt-10和Pt-1与通过每pt原子的1eg撞击的硅衬底结合的Pt-1与硅衬底结合的硅衬底。通过使用扫描隧道显微镜通过对其图像的统计分析获得它们的高度和直径。 Pt-10稳定地与Si表面结合,因为在冲击时,在撞击时插入Si原子进入簇中的Si原子,并且在真空条件下开始在623和673k之间分解。 PT10SIX磁盘的热稳定性与在Si衬底上制备的Pt薄膜的热稳定性相当,但是在Si衬底上的Pt-30磁盘的Pt薄膜。与Si衬底上的PT原子的热行为和PTSI薄膜相比,已经得出结论,即更多的Si原子开始在623和673k之间扩散到PT10Six盘中,而它们不进入具有Pt-30磁盘PT原子的封闭布置高达673 k,由于Si插入近距离填充的簇盘,而不是进入PT10SIX磁盘的较高屏障,其具有较长的PT-PT核距离。

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