首页> 外文期刊>Superconductor Science & Technology >Extended electronic structure inhomogeneity created by double chain layer defects surrounding columnar tracks in heavy-ion irradiated YBa2Cu3O7-delta
【24h】

Extended electronic structure inhomogeneity created by double chain layer defects surrounding columnar tracks in heavy-ion irradiated YBa2Cu3O7-delta

机译:通过双链层缺陷围绕柱状曲线辐照的双链层缺陷产生的扩展电子结构不均匀性,YBA2CU3O7-DELTA

获取原文
获取原文并翻译 | 示例
           

摘要

In YBa2Cu3O7-delta (YBCO), heavy-ion irradiation creates continuous amorphous tracks that are highly effective for vortex pinning. However, the electronic structure landscape of defects and consequently their vortex pinning roles are unclear. Here, we show double chain layer (DCL) defects which intersect the columnar tracks are additionally produced by high energy Pb ion irradiation in YBCO. The DCL defects are similar to 29 nm long, about three times the columnar defect diameter. The electronic structures of the DCL and columnar track defects were determined using atomic-resolution scanning transmission electron microscopy (STEM) and high resolution electron energy loss spectroscopy (EELS). Results show a decrease in the oxygen and copper content at the interface between the track and the YBCO matrix, resulting in interfacial strain. For the DCL defects, the STEM/EELS study revealed a localized electron doped CuO2 plane next to the DCL defect. The DCL defects thus further extend the electronic inhomogeneity into YBCO.
机译:在YBA2CU3O7-DELTA(YBCO)中,重离子照射产生连续的无定形轨道,对于涡旋钉扎有高效。然而,缺陷的电子结构景观以及它们的涡旋固定作用尚不清楚。这里,我们显示了在YBCO中的高能量Pb离子照射另外产生柱状轨道的双链层(DCL)缺陷。 DCL缺陷类似于29 nm长,柱状缺陷直径的约三倍。使用原子分辨率扫描透射电子显微镜(茎)和高分辨率电子能量损失光谱(EEL)测定DCL和柱状轨迹缺陷的电子结构。结果显示轨道与YBCO基质之间的界面处的氧气和铜含量的降低,导致界面菌株。对于DCL缺陷,茎/鳗化研究揭示了DCL缺陷旁边的局部电子掺杂CuO2平面。因此,DCL缺陷进一步将电子不均匀性延伸到YBCO中。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号