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Stress and Deformation Analysis of Piezoresistive Square Diaphragm Nano Pressure Sensor

机译:压阻式方形隔膜纳米压力传感器的应力与变形分析

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摘要

Pressure sensors are among the most widely used MEMS product as sensors in commercial and industrial applications. The diaphragm structure, thickness, and dimensions along with the placement, size, and shape of the piezo resistors are important in the process of designing a pressure sensor. This paper presents the design and simulation of the square diaphragm to analysis the deformation and stress of various materials as well as for the different thickness of the diaphragms at low pressure in the range of 0.1 to 1.5 bar. The design of diaphragm is as a 10 μm thick square diaphragm with 800 μm edge length are considered, which were analyzed by using ANSYS 17 software. The results show that deformation and stress reduction as in the increase in the thickness, which is directly related to the performance of the diaphragm. CNT based diaphragm also showed the improved performance of the pressure sensor as compared to the silicon and polysilicon material.
机译:压力传感器是商业和工业应用中最广泛使用的MEMS产品之一。 隔膜结构,厚度和尺寸以及压电电阻器的放置,尺寸和形状在设计压力传感器的过程中是重要的。 本文介绍了方形隔膜的设计和仿真,以分析各种材料的变形和应力,以及在低压范围内的膜片的不同厚度在0.1至1.5巴的范围内。 隔膜的设计作为10μm厚的方形隔膜,考虑了800μm边缘长度,通过使用ANSYS 17软件分析。 结果表明,变形和应力降低,与厚度的增加,与膜片的性能直接相关。 基于CNT基的隔膜还显示与硅和多晶硅材料相比的压力传感器的改进性能。

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