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Investigation on the correlation between energy deposition and clustered DNA damage induced by low-energy electrons

机译:低能量电子诱导能量沉积与聚类DNA损伤相关性的研究

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This study presents the correlation between energy deposition and clustered DNA damage, based on a Monte Carlo simulation of the spectrum of direct DNA damage induced by low-energy electrons including the dissociative electron attachment. Clustered DNA damage is classified as simple and complex in terms of the combination of single-strand breaks (SSBs) or double-strand breaks (DSBs) and adjacent base damage (BD). The results show that the energy depositions associated with about 90% of total clustered DNA damage are below 150 eV. The simple clustered DNA damage, which is constituted of the combination of SSBs and adjacent BD, is dominant, accounting for 90% of all clustered DNA damage, and the spectra of the energy depositions correlating with them are similar for different primary energies. One type of simple clustered DNA damage is the combination of a SSB and 1-5 BD, which is denoted as SSB + BD. The average contribution of SSB + BD to total simple clustered DNA damage reaches up to about 84% for the considered primary energies. In all forms of SSB + BD, the SSB + BD including only one base damage is dominant (above 80%). In addition, for the considered primary energies, there is no obvious difference between the average energy depositions for a fixed complexity of SSB + BD determined by the number of base damage, but average energy depositions increase with the complexity of SSB + BD. In the complex clustered DNA damage constituted by the combination of DSBs and BD around them, a relatively simple type is a DSB combining adjacent BD, marked as DSB + BD, and it is of substantial contribution (on average up to about 82%). The spectrum of DSB + BD is given mainly by the DSB in combination with different numbers of base damage, from 1 to 5. For the considered primary energies, the DSB combined with only one base damage contributes about 83% of total DSB + BD, and the average energy deposition is about 106 eV. However, the energy deposition increases with the complexity of clustered DNA damage, and therefore, the clustered DNA damage with high complexity still needs to be considered in the study of radiation biological effects, in spite of their small contributions to all clustered DNA damage.
机译:本研究介绍了能量沉积和聚类DNA损伤之间的相关性,基于由低能量电子引起的直接DNA损伤的光谱仿真,包括分离电子附件的直接DNA损伤的光谱。在单链断裂(SSB)或双链断裂(DSB)和相邻的基础损伤(BD)的组合方面,聚类DNA损伤被归类为简单和复杂。结果表明,与总集群DNA损伤的约90%相关的能量沉积低于150eV。由SSB和相邻BD组合构成的简单聚类DNA损伤是显性的,占所有聚类DNA损伤的90%,并且与它们相关的能量沉积的光谱类似于不同的原始能量。一种简单的聚类DNA损伤是SSB和1-5 BD的组合,其表示为SSB + BD。 SSB + BD至总群群体DNA损伤的平均贡献达到了考虑的主要能量的约84%。在所有形式的SSB + BD中,SSB + BD仅包括一个基本损坏的占主导地位(高于80%)。另外,对于考虑的主要能量,通过基本损伤的数量确定的SSB + BD的固定复杂性的平均能量沉积之间没有明显的差异,但是平均能量沉积随着SSB + BD的复杂性而增加。在由DSB和BD的组合构成的复合聚类DNA损伤中,相对简单的类型是组合相邻BD的DSB,标记为DSB + BD,它具有大量贡献(平均高达约82%)。 DSB + BD的频谱主要由DSB与不同数量的基本损坏组合给出,从1到5.对于考虑的主要能量,DSB结合只有一个碱基损坏有助于总DSB + BD的约83%,平均能量沉积约为106eV。然而,能量沉积随着聚类DNA损伤的复杂性而增加,因此,在辐射生物效应的研究中,仍需要考虑具有高复杂性的聚类DNA损伤,尽管它们对所有聚类的DNA损伤的贡献很小。

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