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首页> 外文期刊>Low temperature physics: Simultaneous Russian - English publication >Resonant surface scattering and dislocation flutter explain Kapitza resistance at a solid/solid He-4 interface
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Resonant surface scattering and dislocation flutter explain Kapitza resistance at a solid/solid He-4 interface

机译:谐振表面散射和位错颤动解释了固体/固体HE-4接口的Kapitza电阻

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摘要

In this report we investigate the Kapitza resistance R-K at an interface between a classical solid and a He-4 quantum crystal, as a function of temperature. We provide a premise for R-K based on a combination of two separate mechanisms which occur simultaneously. Owing to the fact that the phonon wavelengths in solid He-4 and in the superfluid are of the same order of magnitude, we infer that one mechanism is due to resonant scattering of phonons by nanoscale surface roughness as predicted by Adamenko and Fuks(1) for solid/superfluid interfaces. The other mechanism involves the interaction of thermal phonons with mobile vibrating dislocations within solid He-4. The present analysis demonstrates the plausibility of these two mechanisms in solving the long outstanding problem of the Kapitza resistance anomaly of solid He-4 in contact with copper for temperatures ranging from 0.4 to 2 K.
机译:在本报告中,我们在经典固体和HE-4量子晶体之间的界面处研究Kapitza电阻R-K,作为温度的函数。 我们根据同时发生的两个单独机制的组合提供R-K的前提。 由于Solid He-4和Superfluid中的声子波长具有相同的数量级,我们推断一种机制是由于Adamenko和Fuks(1)预测的纳米级表面粗糙度的声子的谐振散射 适用于Solid / SuperFluID接口。 另一机制涉及热声子与在固体HE-4内的移动振动脱位的相互作用。 本分析表明这两种机制在解决固体HE-4的KAPITZA抗性异常的长突出问题与铜的长度为0.4至2K的温度。

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