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首页> 外文期刊>Aerosol Science and Technology: The Journal of the American Association for Aerosol Research >Sub-3nm Particle Detection with Commercial TSI 3772 and Airmodus A20 Fine Condensation Particle Counters
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Sub-3nm Particle Detection with Commercial TSI 3772 and Airmodus A20 Fine Condensation Particle Counters

机译:使用商用TSI 3772和Airmodus A20精细冷凝粒子计数器进行亚3纳米粒子检测

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摘要

In this work, we explored the possibility to detect sub-3nm particles with commercially available TSI 3772 and Airmodus A20 Condensation Particle Counters (CPCs), when operated under modified temperature and inlet flow settings. We generated highly monodisperse sub-3nm nanoparticles and characterized the CPCs with temperature differences between the saturator and the condenser varying from 36oC (the 36/37 settings) to 40oC (the 40/40 settings), while the factory settings were 17 and 24oC. The 36/37 settings yielded no homogeneously nucleated background in dry conditions. With these settings, the detection efficiency was significantly improved from the factory settings, resulting in the detection of the smallest charged particles down to below 1.5nm compared with the nominal cut-sizes of 10 and 7nm. With the 40/40 settings and consequently higher supersaturation, homogeneous nucleation produced a background of around 0.5-2cm(-3), while the CPCs were sensitive to charged particles down to 1nm in mobility diameter. The supersaturation field corresponding to the new operation conditions with the 36/37 settings was modeled by using COMSOL and OpenFOAM. The observations were reproduced very well by applying the heterogeneous nucleation theory to the obtained supersaturation field. Our work shows that the TSI 3772 and Airmodus A20 fine CPCs can have a comparable performance with a more expensive ultrafine CPC, such as TSI 3776, thus offering a widely available tool for the detection of sub-3nm particles.
机译:在这项工作中,我们探索了在修改的温度和入口流量设置下运行时,使用市售的TSI 3772和Airmodus A20冷凝颗粒计数器(CPC)检测3 nm以下颗粒的可能性。我们生成了高度单分散的亚3nm纳米粒子,并用饱和器和冷凝器之间的温差从36oC(36/37设置)到40oC(40/40设置)变化对CPC进行了表征,而出厂设置为17oC和24oC。在干燥条件下,36/37设置不会产生均一的有核背景。通过这些设置,与出厂设置相比,检测效率得到了显着提高,与标称切割尺寸10和7nm相比,检测到的最小带电粒子降至1.5nm以下。使用40/40设置并因此具有更高的过饱和度,均匀成核产生的背景约为0.5-2cm(-3),而CPC则对迁移率直径低至1nm的带电粒子敏感。使用COMSOL和OpenFOAM对与36/37设置的新操作条件相对应的过饱和字段进行了建模。通过将非均相成核理论应用于获得的过饱和场,可以很好地再现观察结果。我们的工作表明,TSI 3772和Airmodus A20精细CPC可以与更昂贵的超精细CPC(例如TSI 3776)具有可比的性能,从而为检测3nm以下的微粒提供了广泛可用的工具。

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