Optimization of the genetic algorithm of jointly fitting different types of X-ray scattering curves

摘要

A method for jointly processing X-ray scattering data of different types is developed. It is shown that, by optimizing the genetic algorithm of the joint solution of the inverse problem of X-ray diffractometry and reflectometry, one can reduce the amount of calculations and reliably determine the parameters of layers in the structure under study, even when the information about them is a priori limited.