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Unified method for the determination of chemical composition in different types of materials using Wavelength Dispersive X-ray Fluorescence Spectrometry

机译:使用波长分散X射线荧光光谱法测定不同类型材料中化学成分的统一方法

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The aim of the article is to show that determination of the main chemical composition with Wavelength Dispersive X-ray Fluorescence Spectrometry method does not require the use of separate analytical applications and procedures for the tests of materials of different origin. This is however conditioned upon calcination of the tested initial sample at the temperature of 815 degrees C to remove organic matter and its preparation for X-ray measurements by fusing into a borate bead. Within the framework of the conducted research a special analytical application measuring 10 oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, Na2O, K2O, SO3, TiO2 and P2O5 was developed. Standards and certified reference materials (CRMs) were applied for calibration. Synthetic standards with the use of oxides and salts of purity of 99.99% were also prepared to complete the measuring points on the calibration curves The curves determined based on the measuring points have high correlation coefficients and accuracy. The alpha empirical correction coefficients were applied to correct matrix effects. The range of the method was confirmed based on the measurements of 13 synthetic standards. The average values of the standard deviations in the lower range of the calibration curves were between 0.0008% for K2O and 0.0056% for Na2O and 0.0054% for MgO. The average values of the relative standard deviation were in the range between 1.81% for K2O and 13.92% for MgO and 11.21% for Na2O, respectively. In the upper range of the calibration curves, the average values of standard deviation were between 0.079% for TiO2 and 0.962% for P2O5, and the relative standard deviation was between 0.05% for SiO2 and 2.39% for P2O5. The accuracy of the developed WDXRF method was assessed based on the measurement of 10 certified reference materials representing all the tested materials (cement, coal ash, slag, fire clay, sediment and soil). Out of 98 conducted measurements (two CRMs did not contain the declared content of P2O5 and SO3 respectively), in 68 measurements, relative errors were below 5%, and, in next 27 measurements, they were between 5% and 10%. The errors were comparable for all the tested materials which confirms that in WDXRF analyses of borax beads the type, kind and origin of a sample do not affect accuracy of the obtained measurements. (C) 2020 The Author(s). Published by Elsevier Ltd.
机译:本文的目的是表明,具有波长分散X射线荧光光谱法的主要化学成分的测定不需要使用单独的分析应用和程序进行不同起源的材料的测试。然而,这在815℃的温度下煅烧测试的初始样品以除去有机物质并通过熔合到硼酸盐珠粒的X射线测量的制备时。在进行研究的框架内,开发了一种特殊的分析应用测量10氧化物:SiO 2,Al 2 O 3,Fe 2 O 3,CaO,MgO,Na 2 O,K 2 O,SO 3,TiO 2和P2O5。标准和认证参考资料(CRMS)施用校准。使用氧化物的合成标准和纯度为99.99%的盐也准备完成校准曲线上的测量点,该曲线基于测量点确定的曲线具有高的相关系数和精度。 alpha经验校正系数被应用于正确的矩阵效应。基于13个合成标准的测量来确认该方法的范围。校准曲线的较低范围内标准偏差的平均值为K2O的0.0008%,Na 2 O的0.0056%,MgO为0.0054%。相对标准偏差的平均值分别为3.81%的k2O和13.92%的MgO和Na 2 O的11.21%。在校准曲线的上部,标准偏差的平均值为0.079%的TiO2和0.962%的P2O5,并且对于P2O5的SiO 2和2.39%的相对标准偏差为0.05%。基于10经认证的参考资料的测量评估了所发育的WDXRF方法的准确性,该方法代表所有测试材料(水泥,煤灰,渣,火粘土,沉积物和土壤)。在98中进行的测量(分别不含P2O5和SO 3的申报),在68次测量中,相对误差低于5%,并且在接下来的27测量中,它们在5%和10%之间。所有测试材料的误差都是可比的,证实在硼砂珠的WDXRF分析中,样品的类型,种类和原点不会影响所获得的测量的精度。 (c)2020提交人。 elsevier有限公司出版

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