Towards more reliable AFM force-curve evaluation: A method for spring constant selection, adaptive lever sensitivity calibration and fitting boundary identification

摘要

This work discusses key issues regarding the atomic force microscopy (AFM) force-curve evaluation practice, which can affect the determined Young's modulus of the investigated sample. These issues are 1) the proper calibration of lever sensitivity and the effect of its variation between the measurements; 2) the selection of proper cantilever spring constant for the investigated sample; and 3) the selection of the fitting boundaries for the contact mechanics model-based force-curve evaluation. A method is proposed, which solves the above mentioned issues, namely, categorizes the obtained force-curves based on the relation between the elastic properties of the sample and the spring constant of the cantilever, and thus helps in the selection of the proper spring constant for the given surface; helps in the identification of the optimal model-fitting boundaries, and also, provides a way of adaptive lever sensitivity calibration. The method is demonstrated on PDMS (polydimethylsiloxane) samples, which were irradiated with various fluences of ion beams to control their elastic properties in the 4 MPa - 22 GPa range. Our proposed method, if applied correctly can significantly increase the reliability of AFM force-curve evaluation.