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Dual-Laser Integrated Microwave Imaging System for Nondestructive Testing of Construction Materials and Structures

机译:双激光集成微波成像系统,用于建筑材料和结构的无损检测

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摘要

Microwave near-field imaging techniques have been successfully used for the nondestructive testing of construction materials in civil infrastructures. In this technique, the distance between the microwave antenna and the material, which is referred to as standoff distance is an important parameter. The standoff distance should be kept constant during the scanning process or there should be a proper compensation method to overcome any change in the distance. The undesired change in the standoff distance may mask the indication of flaws. However, civil infrastructures are composed of construction materials with different geometrical shapes and sharp edges, and maintaining the constant standoff distance during the scanning process is a challenging task. For this purpose, a novel dual-laser integrated microwave imaging system is proposed. The proposed system consists of a novel integrated sensing unit with two laser displacement sensors and a single microwave antenna that automatically follows the contour of the material under test at a constant standoff distance and generates microwave images. The proposed system performs contour following at hardware level and does not require any calibration or complex compensation algorithm. The comparison of two microwave antennas is performed to find the suitable antenna for different materials. The proof of concept of the developed system for the nondestructive testing of construction materials with different geometrical shapes is provided.
机译:微波近场成像技术已成功用于民用基础设施的建筑材料的非破坏性测试。在该技术中,微波天线与材料之间的距离称为距离距离是重要参数。在扫描过程中,支座距离应保持恒定,或者应该有一个适当的补偿方法来克服距离的任何变化。支座距离的不期望的变化可能掩盖缺陷的指示。然而,民用基础设施由具有不同几何形状和尖锐边缘的施工材料构成,并在扫描过程中保持恒定的支座距离是一个具有挑战性的任务。为此目的,提出了一种新型双激光集成微波成像系统。所提出的系统包括一种具有两个激光位移传感器的新型集成感测单元,以及单个微波天线,其自动跟随在恒定的支座距离处的被测材料的轮廓并产生微波图像。所提出的系统在硬件级别执行轮廓,不需要任何校准或复杂的补偿算法。执行两个微波天线的比较以找到用于不同材料的合适天线。提供了具有不同几何形状的建筑材料无损检测的开发系统概念证明。

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