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首页> 外文期刊>Materials science in semiconductor processing >Annealing effects on the electrical properties of spin coated poly (3-hexylthiophene) (P3HT) thin films
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Annealing effects on the electrical properties of spin coated poly (3-hexylthiophene) (P3HT) thin films

机译:对旋涂聚(3-己基噻吩)(P3HT)薄膜电性能的退火效应

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摘要

Poly (3-hexylthiophene-2, 5-diyl) (P3HT) thin films were prepared using spin coating technique and the effect of annealing on the bias switching for memory applications were studied. Due to annealing, the threshold voltage for switching was reduced considerably. In bias switching, threshold voltage was least for the sample annealed at 100 C-omicron. Addition of phenyl-C61-butyric acid-methyl-ester (PCBM) into P3HT also reduced the threshold voltage. It was also found that the devices with gold (Au) top electrode switched at a lower threshold voltage compared to their aluminium (Al) counterparts.
机译:使用旋涂技术制备聚(3-己基噻吩-2,5-二基)(P3HT)薄膜,研究了退火对存储器应用的偏置切换的影响。 由于退火,切换的阈值电压显着降低。 在偏置切换中,阈值电压至少适用于在100 C-OMICRON退火的样品。 将苯基-C61-丁酸 - 甲基酯(PCBM)加入P3HT也降低了阈值电压。 还发现,与其铝(Al)对应物相比,具有金(Au)顶电极的顶部电极的器件在较低阈值电压下切换。

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