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首页> 外文期刊>Materials science in semiconductor processing >Fabrication of Au gratings by seedless electroplating for X-ray grating interferometry
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Fabrication of Au gratings by seedless electroplating for X-ray grating interferometry

机译:通过无籽电镀制造Au光栅用于X射线光栅干涉法

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摘要

High quality gratings are among the key elements for successful imaging with X-ray grating interferometry. Grating fabrication, specifically of absorption gratings, with high aspect ratio and large area, is a great challenge from a microfabrication point of view. In this paper the fabrication of absorption gratings by seedless electro-plating of gold in high aspect ratio silicon moulds that are fabricated by deep reactive ion etching (Bosch process) is presented. We report on our latest results and discuss the possibility of reducing the grating period down to 1.3 mu m. In addition, the quality of the gratings is assessed by performing visibility measurements and imaging various samples on a compact in house X-ray grating interferometer.
机译:高质量的光栅是用X射线光栅干涉测量成功成功成功的关键元件中的关键元素。 特别是具有高纵横比和大面积的吸收光栅的光栅制造是从微制造的观点来看的巨大挑战。 在本文中,呈现了通过深度反应离子蚀刻(博世工艺)制造的高纵横比硅模具中的无籽电镀的吸收光栅的制造。 我们报告了我们的最新结果,并讨论将光栅期降至1.3亩的可能性。 另外,通过在室内X射线光栅干涉仪的紧凑型上进行可视性测量和成像来评估光栅的质量。

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