Determination of niobium diffusion in titania and zirconia using secondary ion mass spectrometry

摘要

This paper provides an outline for the use of secondary ion mass spectrometry (SIMS) in the determination of diffusion data in metal oxides. The focus is on the determination of Nb bulk and grain boundary diffusion coefficients in TiO_2 and zirconia. Specifically, the diffusion of Nb in TiO_2 and yttria doped (10 mol.- percent) ZrO_2 (10YSZ) has been assessed. The following bulk diffusion coefficients D_[(93)_(Nb)] were obtained D_[(93)_(Nb)] = (1.03 + 0.05l) X 10~(-18) m~2 s~(-1) 10YSZ(1273K) D_[(93)_(Nb)] = (1.91+ 0.096) X 10~(-16) m~2 s~(-1) TiO_2(1273K) The grain boundary diffusion parameter for Nb grain boundary diffusion in 10YSZ was also determined D_[(93)_(Nb)] delta alpha = (7.48 +- 0.37) X 10~(-25) m~2 s~(-1) 10YSZ(1273K) The Nb grain boundary diffusion coefficient D'_[(93)_(Nb)] was determined to be D'_[(93)_(Nb)] = (3.99 + 0.20) X 10~(-16) m~2 s~(-1) 10YSZ(1273K).