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Investigating the structure of crosslinked polymer brushes (brush-gels) by means of Positron Annihilation Spectroscopy

机译:通过正电子湮没光谱研究交联聚合物刷(刷胶)的结构

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摘要

Polymer brushes can be useful as small-scale reactors for the controlled synthesis of nanoparticles, an approach which is gaining increasing interest. In this context, chemical crosslinking of polymer brushes could be considered as a viable approach to control the size and size distribution of the formed nanoparticles. Here we describe the application of Positron Annihilation Spectroscopy (PAS) for the characterization of crosslinked polymer brushes (brush-gels). Poly(hydroxyethyl methacrylate) (PHEMA) brushes were obtained on silicon substrates by means of a surface-initiated atom transfer radical polymerization (SI-ATRP). Crosslinking was achieved during the polymerization by adding different amounts of diethyleneglycol dimethacrylate (DEGDMA) as a difunctional monomer. The resulting brushes, both un- and crosslinked, were then post-modified with carboxylic acid groups, allowing the in situ synthesis of silver nanoparticles after ion exchange with silver nitrate and reduction with sodium borohydride. The detailed characterization of such systems is notoriously challenging and PAS proved to be an effective, non-invasive technique to acquire insight on the structure of the brushes and of their nanoparticle composites.
机译:聚合物刷子可用作用于控制合成纳米颗粒的小规模反应器,这是一种增加兴趣的方法。在这种情况下,聚合物刷的化学交联可以被认为是控制所形成的纳米颗粒的尺寸和尺寸分布的可行方法。在这里,我们描述了正电子湮没光谱(PAS)在交联聚合物刷子(刷凝胶)的表征中的应用。通过表面引发的原子转移自由基聚合(Si-ATRP)在硅基衬底上获得聚(甲基丙烯酸甲酯)(PHEMA)刷子。通过将不同量的二乙二醇二甲基丙烯酸二甲基丙烯酸二甲基丙烯酸二甲基丙烯酸酯(DEGDMA)作为双官能单体在聚合过程中达到交联。然后将所得刷子和交联的刷子用羧酸基团进行后修饰,允许在离子交换之后用硝酸银和用硼氢化钠还原,原位合成银纳米颗粒。这种系统的详细表征是臭名昭着的挑战性,并且PA被证明是获得对刷子结构和其纳米颗粒复合材料的结构的有效的非侵入性技术。

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