EARLY LIFE AUTOMOTIVE ELECTRONICS FAILURES AND THEIR ROOT CAUSES

摘要

INTRODUCTION In automotive electronics, failures are frequently found that cannot be explained by the failure signatures of the defective devices. In deeper investigations, it turns out that a superimposition of impact factors, which never can be represented by the usual qualification testing, caused the failure. Numerous cases presented the opportunity to be examined in depth, including system-based analysis and failure anamnesis (similar to a complete medical history) in root cause evaluations. This article describes several examples and concludes with general principles for how to proceed with these types of failures.