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Electrical Characteristics and Nanocrystalline Formation of Sprayed Iridium Oxide Thin Films

机译:喷涂氧化铱薄膜的电学特性和纳米晶形成

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Nanostructure and electrical properties of iridium oxide (IrO_2) thin films prepared by spray pyrolysis technique (SPT) have been experimentally characterized. The effect of solution molarity (SM) and substrate temperature (T_(sub)) on the nanostructure features and electrical conductivity of these films has been investigated. The results of X-ray diffraction (XRD) showed that all samples prepared at T_(sub) = 350℃ with different SM, IrO_2 appear almost in amorphous form. XRD revealed that the films deposited at T_(sub) = 450℃ were tetragonal structures with a preferential orientation along (101) direction.Moreover, the degree of crystallinity was improved by solution molarity. Single order Voigt profile method has been used to determine the nanostructure parameters at different SM and T_(sub). The dark conductivity measurements at room temperature as a function of SM were observed and the value of conductivity were slightly increases at higher SM, reaching the bulk value of 20 Ω~(-1)cm~(-1). The values of activation energy of ΔE and σo of IrO_2 were found to be 0.21 eV and 1.68 × 10~(-3)Ω~(-1) · cm~(-1), respectively.
机译:通过喷雾热解技术(SPT)制备的氧化铱(IrO_2)薄膜的纳米结构和电学性能已得到实验表征。研究了溶液摩尔浓度(SM)和底物温度(T_(sub))对这些薄膜的纳米结构特征和电导率的影响。 X射线衍射(XRD)结果表明,在T_(sub)= 350℃制备的所有样品中,SM,IrO_2不同,几乎都以非晶态存在。 XRD分析表明,在T_(sub)= 450℃下沉积的薄膜为四方结构,沿(101)方向优先取向。此外,溶液的摩尔浓度提高了结晶度。已使用单阶Voigt轮廓方法确定不同SM和T_(sub)下的纳米结构参数。观察到室温下暗电导率随SM的变化,较高的SM时电导率值略有增加,达到了20Ω〜(-1)cm〜(-1)的体积值。 IrO_2的ΔE和σo的活化能分别为0.21 eV和1.68×10〜(-3)Ω〜(-1)·cm〜(-1)。

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