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Thermal Fracture Toughness of a Bi-Material Layer

机译:双层材料的热断裂韧性

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摘要

Fracture at the interface between dissimilar materials becomes an important issue in many bi-material layered systems, such as composites and micro-electronic devices. It is well known that there are large thermal expansion coefficient mismatches between the individual layers of the electronic assemblies. The mismatch can lead to large thermal stress at the interface resulting in thermal cracks during the operation. To avoid such failure in bi-layered structure, it is necessary to provide a simple and efficient analytical model, so that the stress level in the layers can be accurately estimated. Basing on the Bernoulli beam theory, a simple but accurate analytical formulation is derived for the calculation of the thermal stress and the strain energy release rate due to the thermal mismatch in bi-material layered structures. The analytical results are compared with finite element analysis results. The good agreement shows that the proposed approach is able to provide an efficient way for the calculation of strain energy release rate in bi-material layered structures. The effects of layer thickness and material property on the fracture toughness are presented through a parametric study.
机译:在许多双材料分层系统(例如复合材料和微电子设备)中,异种材料之间的界面处的断裂已成为重要的问题。众所周知,在电子组件的各个层之间存在较大的热膨胀系数失配。失配会导致界面处的热应力过大,从而导致操作过程中出现热裂纹。为了避免双层结构中的这种破坏,有必要提供一个简单而有效的分析模型,以便可以准确地估计各层中的应力水平。基于伯努利梁理论,导出了一种简单而精确的分析公式,用于计算双材料层状结构中的热失配引起的热应力和应变能释放速率。将分析结果与有限元分析结果进行比较。良好的协议表明,所提出的方法能够为双材料层状结构中的应变能释放速率的计算提供一种有效的方法。通过参数研究显示了层厚度和材料性能对断裂韧性的影响。

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