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首页> 外文期刊>International journal of applied earth observation and geoinformation >The long-wave infrared (8-12 mu m) spectral features of selected rare earth element-Bearing carbonate, phosphate and silicate minerals
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The long-wave infrared (8-12 mu m) spectral features of selected rare earth element-Bearing carbonate, phosphate and silicate minerals

机译:选择稀土元素含碳酸酯,磷酸盐和硅酸盐矿物的长波红外(8-12μm)光谱特征

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摘要

Rare earth elements (REEs) are a group of metals essential to high technology industries. This high demand, combined with a high supply risk, has led to an understanding that REEs are critical to society. Despite the potential that hyperspectral imaging (HSI) data offers for a fast and non-invasive characterization of the REEs, it is still poorly understood whether REEs have some information in the long-wave infrared (LWIR; 8-12 mu m) wavelength range that can be used for their identification. To partially fill this gap, we have investigated the spectroscopy of twelve REE-bearing mineral samples using relatively high spatial and spectral resolution LWIR hyperspectral imaging data. These samples were formerly characterized using electron probe microanalysis (EPMA), scanning electron microscopy (SEM), and hyperspectral imaging data acquired in the 0.4-2.5 mu m wavelength range. Results from these analyses were compared to and used to guide the analysis of the HSI data recorded in the LWIR range. This information was further compared to a reference spectral library of rare earth oxides. Our findings suggest that the spectral features of the samples can generally be traced to the asymmetric degenerate stretching and bending modes of the X-O (X = C, Si, P) groups. Moreover and contrary to what has been observed in the shorter wavelengths, there are no definitive spectral features in the LWIR wavelength region that could be assigned to any specific REE.
机译:稀土元素(REES)是一组对高科技产业至关重要的金属。这种高需求与高的供应风险相结合,导致了对社会至关重要的理解。尽管潜在的高光谱成像(HSI)数据提供了REES的快速和非侵入性表征,但仍然明白REES是否在长波红外(LWIR;8-12μm)波长范围内有一些信息这可以用于其识别。为了部分填充这种差距,我们研究了使用相对高的空间和光谱分辨率LWIR高光谱成像数据的十二个携带矿物样品的光谱学。以前使用电子探针微分析(EPMA),扫描电子显微镜(SEM)和在0.4-2.5μm波长范围内获得的高光谱成像数据来表征这些样品。将这些分析的结果进行比较,并用于指导在LWIR范围内记录的HSI数据的分析。该信息进一步与稀土氧化物的参考光谱库相比。我们的研究结果表明样品的光谱特征通常可以追溯到X-O(X = C,Si,P)组的不对称退化拉伸和弯曲模式。此外,与在较短波长中观察到的相反,在可以分配给任何特定的REE的LWIR波长区域中没有明确的光谱特征。

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