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Spectral absorption coefficient extraction of an unknown layer from photoacoustic measurements of multilayered semiconductors

机译:多层半导体光声测量中未知层的光谱吸收系数

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摘要

This paper reports on a theoretical relation for the normalized photoacoustic amplitude signal for use in determining the optical absorption coefficient spectrum of any layer of multilayered semiconductors' samples. The derived relation is for use in gas-coupled photoacoustic cells. The model, unlike its predecessors so far reported in the literature that are usually for specific cases in dependence of the optical properties of the sample, takes into considerations the geometrical sample, the photoacoustic cell parameters, the thermal reflections as well as the light reflections at different interfaces. We present the results analysis on the effect of increasing the number of layers on the normalized photoacoustic response by considering particular applications in optoelectronic devices' configurations. A computer program has been developed to extract the absorption coefficient spectral distribution of any particular layer. Three specific experimental applications are provided in evaluating the performance of the present model. Unlike conventional spectroscopic techniques, the photoacoustic method is known for high delectability in the region of weak absorption. Hence, the applications we present here include the cases of a single transparent sample, a thin solid single crystal and embedded layer in a three-layered sample.
机译:本文报告了用于归一化光声幅度信号的理论关系,用于确定任何层的多层半导体样品的光学吸收系数谱。衍生的关系用于气体耦合光声电池。与迄今为止在文献中报告的模型,通常用于依赖于样品的光学性质的特定病例,考虑到几何样本,光声电池参数,热反射以及光反射不同的接口。我们通过考虑光电器件配置中的特定应用,提出了增加归一化光声反应上的层数的效果的结果分析。已经开发了一种计算机程序以提取任何特定层的吸收系数谱分布。在评估本模型的性能方面提供了三种特定的实验应用。与传统的光谱技术不同,光声方法在弱吸收区域中已知用于高层的美味性。因此,我们在此存在的应用包括单个透明样品的情况,在三层样品中包括单个透明样品,薄的固体单晶和嵌入层。

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