NON DESTRUCTIVE ANALYSIS OF CARBON NANOTUBE BASED STRAIN SENSOR USING RAMAN ANALYSIS AND RAMAN MAPPING

摘要

The objective of this work is to use techniques like Raman analysis, XRD and AFM imaging to confirm that multiwall carbon nanotubes (MWCNT) based Polyvinylidene Fluoride (PVDF) composites can be used in strain sensing engineering applications. I-D/I-G ratio, obtained from Raman Analysis is used to predict the defect level and study the details related to uniformity and smoothness of an unstrained film with respect to a strained film. By comparing the band shift in the spectra, the defect level present in a strained specimen compared to that of an unstrained specimen can be predicted. Area mapping is also carried out to cheek the homogeneity of the film. AFM analysis is also carried out to correlate the relationship between surface roughness and defects of the film with ID/ IG ratio obtained from Raman Spectrum.