STUDY OF FACTORS DETERMINANT OF SILICEOUS ELECTRICAL PORCELAIN RESISTANCE TO STRUCTURAL DEGRADATION

摘要

The subject of this study was investigation of the factors that have a decisive influence on the resistance of siliceous porcelain to degradation processes. There was tested material C 110 type, which is widely used for the production of lowvoltage (LV) elements such as insulators and bushings. On the basis of mechanical-acoustic and microscopic research of small-sized samples, which were subjected to compression, there were distinguished successive stages of degradation of the material structure. In the authors' opinion, they have a reference to the ageing process, taking place during many years of work under operating conditions. Thus, it was possible to assess the structural factors that determine the durability and reliability of LV electroinsulating elements. The results were related to electrical aluminous porcelains.