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(Multi)functional Atomic Force Microscopy Imaging

机译:(多)功能原子力显微镜显微镜成像

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摘要

Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.
机译:将功能掺入原子力显微镜(AFM),以获得物理和化学信息一直是AFM研究的强烈关注。 用特定分子改变AFM探针允许通过特定反应和相互作用来获得化学信息。 对具有高空间分辨率的固体/液体界面的分子过程的基本理解对于许多新兴的研究领域至关重要。 纳米级电化学成像已成为先进AFM技术的互补技术,提供有关电化学界面过程的信息。 虽然本综述提出了一种简要介绍先进的AFM成像模式,例如Multiparametric AFM和地形识别成像,但这里的主要注重是通过混合AFM扫描电化学显微镜的电化学成像。 介绍了最近的应用和与这种纳米电化学成像策略相关的挑战。

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