Identification of Quantitative Trait Loci for Stem-End Chip Defect and Potato Chip Color Traits in a 'Lenape'-Derived Full-Sib Population

摘要

Chipping potatoes are bred for their ability to produce light-colored, defect-free chips. Chips with stem-end chip defect (SECD) have dark blemishes and are undesirable to consumers and chip processors. The heritability of SECD is not known and genetic loci linked to defect formation have not been identified. Chip processing varieties 'Wauseon' and 'Lenape' were crossed and tubers from parents and 191 progeny were evaluated over four years for chip color descriptors L*, a*, and b* and SECD score in January, March, and May. Broad sense heritability for SECD was 0.64 or greater at each sampling time. Genotype data were used to construct a 1282 cM linkage map. Nine quantitative trait loci (QTL) for SECD were detected, and seven overlapped QTL for chip color traits. The QTL identified are starting points for developing molecular markers that are used to select genotypes that produce light-colored chips and have resistance to SECD formation.