Improving the precision of single grain mica Ar-40/Ar-39-dating on smaller and younger muscovite grains: Application to provenance studies

摘要

Current generation multi-collector mass spectrometers allow for increasingly more precise measurements of small ion beams. The improvement of instrument sensitivity and resolution compared with older generation mass spectrometers has important implications for Ar-40/Ar-39 dating and allows the expanding of its range of applicability.