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Nature of Conduction Band Tailing in Hydrogenated Titanium Dioxide for Photocatalytic Hydrogen Evolution

机译:光催化氢进化中氢化钛二氧化钛中的传导带尾矿性质

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The involvement of oxygen vacancies in the electronic and structural properties and photocatalytic activity of hydrogenated TiO2 (H-TiO2) for water splitting are currently under debate. Herein, the process for the formation of oxygen vacancies in H-TiO2 is illustrated for the first time to verify the role of these vacancies on the surface and in the bulk of H-TiO2 by using surface-sensitive soft X-ray techniques and bulk-information-included hard X-ray techniques for the O K-edges and Ti K-edges, respectively. We find that oxygen vacancies on the surface and in the bulk contribute differently to tailing of the conduction band of H-TiO2. By controlling the degree of hydrogenation to restrict tailing of the conduction band to just above the H+/H-2 redox potential, the most favorable disordered structure for photocatalytic H-2 evolution is developed. This work promotes a better understanding of the possible negative consequence of hydrogenated semiconductors in H-2 evolution apart from the positive effect on visible-light response.
机译:目前正在辩论中涉及氢化TiO2(H-TiO2)氢化TiO2(H-TiO2)的电子和结构性能和光催化活性的累积。在此,首次示出了H-TiO 2中氧空位的方法,以验证这些空位在表面上和大部分H-TiO2中的作用,通过使用表面敏感的软X射线技术和散装 - 包括用于O k边缘和Ti k边缘的形状的硬X射线技术。我们发现表面和散装中的氧气空位不同地贡献到H-TiO2的导电带的尾部。通过控制氢化程度限制导电带的拖延至高于H + / H-2氧化还原电位,开发了用于光催化H-2进化的最有利的无序结构。这项工作促进了除了对可见光反应的积极影响之外,更好地理解H-2演化中的氢化半导体的负面后果。

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