首页> 外文期刊>Biosystems Engineering >The development of a hyperspectral imaging method for the detection of Fusarium-damaged, yellow berry and vitreous Italian durum wheat kernels.
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The development of a hyperspectral imaging method for the detection of Fusarium-damaged, yellow berry and vitreous Italian durum wheat kernels.

机译:开发高光谱成像方法以检测镰刀菌(Fusarium)损坏的黄莓和玻璃质意大利硬质小麦粒。

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摘要

The possibility of using hyperspectral imaging (HSI) techniques to classify different types of wheat kernels, vitreous, yellow berry and Fusarium-damaged, was investigated. Conventional optical techniques adopted by industry for wheat grain sorting usually have too high misclassification errors. Reflectance spectra of selected wheat kernels of the three types were acquired by a laboratory device equipped with an HSI system working in near infrared field (1000-1700 nm). The hypercubes were analysed applying different chemometric techniques, such as principal component analysis (PCA) for explorative purposes, partial least squares discriminant analysis (PLS-DA) for classification of the three wheat types and interval PLS-DA (iPLS-DA) for the selection of a reduced set of effective wavelength intervals. The study demonstrated that good classification results were obtained not only considering the entire investigated wavelength range, but also selecting only three narrow intervals of four wavelengths (1209-1230 nm, 1489-1510 nm and 1601-1622 nm) out of 121. The procedures developed could be utilised at industrial level for quality control purposes or for the definition of innovative sorting logics for wheat kernels after an extensive classification campaign, both at laboratory and industrial level, applied to a large wheat sample sets
机译:研究了使用高光谱成像(HSI)技术对不同类型的小麦粒,玻璃质,黄莓和镰刀菌损坏的类型进行分类的可能性。工业上用于小麦籽粒分选的常规光学技术通常具有过高的误分类误差。通过配备有在近红外场(1000-1700 nm)中工作的HSI系统的实验室设备,获得了三种类型的选定小麦籽粒的反射光谱。使用不同的化学计量技术对超立方体进行了分析,例如出于探索性目的的主成分分析(PCA),用于三种小麦类型分类的偏最小二乘判别分析(PLS-DA)和针对三种小麦类型的区间PLS-DA(iPLS-DA)。选择一组减少的有效波长间隔。研究表明,不仅考虑了整个研究的波长范围,而且还从121个中选择了四个波长(1209-1230 nm,1489-1510 nm和1601-1622 nm)的三个窄间隔,获得了良好的分类结果。经过广泛的实验室和工业分类活动,应用于大型小麦样品集后,开发的产品可用于工业控制质量目的或用于定义小麦籽粒的创新分类逻辑

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