Calculation of the resonance effects at electrothermal breakdown of metal-dielectric-metal structures

摘要

Thermofluctuation theory of dielectric diodes destruction was developed, on the base of which the critical electrophysical parameters of oscillating structure changes arising in dielectrics in external constant electrical field were obtained. It was shown, that electron processes at microdefects formation had autowave character and were accompanied by current oscillation, acoustical emission and electromagnetic radiation. This information may by used in remote nondestructive testing of materials and also for defects elimination in solid state electronic devices and verious electrotechnical instruments insulation design.