A thermal fluctuation theory has been developed for damage to metal-insulator-metal diode structures, which has been employed to determine the critical electrophysical parameters for oscillating structural changes arising in the insulator in a steady external electric field. The electronic processes giving rise to microdefects are of autowave origin and are accompanied by current oscillations, acoustic emission, and electromagnetic radiation. This can be used in remote-sensing nondestructive testing, and also for the elimination of manufacturing defects in solid-state electronic devices and the insulation in electrotechnical instruments.
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