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首页> 外文期刊>Journal of Nuclear Materials: Materials Aspects of Fission and Fusion >Microstructural evolution of the 21Cr32Ni model alloy under irradiation
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Microstructural evolution of the 21Cr32Ni model alloy under irradiation

机译:辐照下21Cr32Ni模型合金的微观结构演化

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摘要

The microstructural evolution of the 21Cr32Ni model alloy under ion irradiation is investigated. A set of bulk materials were irradiated at the Michigan Ion Beam Laboratory using single beam (5 MeV Fe++) to 1, 10 and 20 dpa at 440 degrees C and dual beam (5 MeV Fe++ plus energy degraded 1.95 MeV He++ ions) to 16.6 dpa at 446 degrees C. The average diameter and number density of the faulted loops and cavities formed under irradiation were characterized using Transmission Electron Microscopy (TEM). The behavior of faulted loop in the model alloy was also investigated in-situ using the Intermediate Voltage Electron Microscope (IVEM) at Argonne National Laboratory (ANL). Results show that the average faulted loop diameter decreases, but the faulted loop number density increases with increasing dose. In-situ experiments showed that the faulted loops become unfaulted during ion irradiation by interacting with network dislocations. Although the average faulted loop diameter after 16.6 dpa dual beam irradiation at 446 degrees C was found to be similar to those seen in samples irradiated with single beams to 10 and 20 dpa, the faulted loop number density was significantly higher in the dual beam irradiated sample. Moreover, the dual beam irradiated model alloy exhibits a significantly higher density of smaller cavities. It is also found that the size and density of the faulted loops and voids calculated for the dual beam irradiation of 21Cr32Ni model alloy at 446 degrees C are in better agreement with those measured in a sample neutron irradiated at 375 degrees C. Further discussion is presented in this study. (C) 2018 Elsevier B.V. All rights reserved.
机译:研究了21Cr32NI模型合金的微观结构演化。在440℃和双束(5meV Fe ++加能1.95meV He ++离子降解)至16.6dPa的密度束(5mev Fe ++)至1,10和20dPa,在密歇根离子束实验室(5meV Fe ++加能)到16.6dPa在446℃下,使用透射电子显微镜(TEM)表征在照射下形成的断层环和空腔的平均直径和数量密度。使用Argonne National实验室(ANL)的中间电压电子显微镜(IVEM)研究了模型合金中的故障环路的行为。结果表明,平均故障环径直径降低,但由于剂量增加,故障环数密度增加。原位实验表明,通过与网络脱位相互作用,在离子辐射期间,断层循环在离子辐射期间变得不驱动。尽管在446摄氏度下的16.6dPa双光束照射后的平均故障环路直径与用单梁照射到10和20dPa的样品中看到的那些类似,但在双光束辐照样品中断层循环数密度显着较高。此外,双光束照射模型合金表现出明显较高的较高腔密度。还发现,在446摄氏度下为21Cr32Ni模型合金的双光束辐射计算的断层环和空隙的尺寸和密度与在375℃照射的样品中子中测量的那些更好地进行。进一步讨论在这个研究中。 (c)2018年elestvier b.v.保留所有权利。

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