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首页> 外文期刊>Journal of Materials Science >Adsorption of phosgene on Si-embedded MoS2 sheet and electric field-assisted desorption: insights from DFT calculations
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Adsorption of phosgene on Si-embedded MoS2 sheet and electric field-assisted desorption: insights from DFT calculations

机译:Si-Embedded MOS2板和电场辅助解吸光谱的吸附:来自DFT计算的见解

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摘要

In quest of effective materials and technologies for detecting toxic gas molecules, an attempt is made to detect phosgene gas molecule using MoS2 by employing dispersion corrected density functional theory calculations. Doping Si into the S-vacancy of MoS2 monolayer results in improvement of adsorption capability of phosgene gas molecule, reaching adsorption energy of -1.228eV. It is revealed that Si-doped MoS2 sheet is thermodynamically stable at high temperatures, and hence, room temperature stability is expected. Origin of interaction between phosgene and adsorbent is analyzed by calculating density of states, charge transfer, and vibrational frequency. Strong binding and more charge transfer modulate band gap and work function of the Si-doped MoS2 material post-phosgene adsorption indicate that such system is highly sensitive to phosgene. It is further shown that the sensing material is completely recovered by applying 0.6V/ magnitude vertical positive electric field. The reason for reduced stability of the system is revealed by variations in charge transfer process and induced dipole interaction due to the charge redistribution. The results suggest potential application of MoS2-based sheets for sensing phosgene gas molecule, where external electric field efficiently aids reversible adsorption process.
机译:在寻求检测有毒气体分子的有效材料和技术方面,通过采用分散校正的密度官能理论计算来试图使用MOS2检测光气子分子。掺杂Si进入MOS2单层的S型空位,导致致光气体分子的吸附能力,达到-1.228EV的吸附能力。揭示了Si掺杂的MOS2片材在高温下热力学稳定,因此预期室温稳定性。通过计算状态的密度,电荷转移和振动频率来分析光气与吸附剂之间的相互作用起源。强粘合和更多的电荷转移调制带隙和Si掺杂MOS2材料后光气相吸附的工作功能表明这种系统对光气相敏感。进一步示出了通过施加0.6V /幅度垂直正电场来完全回收传感材料。通过电荷转移过程的变化和由于电荷再分布引起的偶极相互作用,揭示了减少系统稳定性的原因。结果表明潜在应用MOS2基片来检测光气子分子,其中外电场有效地有助于可逆吸附过程。

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