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Traps and Interface Fixed Charge Effects on a Solution-Processed n-Type Polymeric-Based Organic Field-Effect Transistor

机译:陷阱和接口固定电荷效应对溶液加工的N型聚合物基有机场效应晶体管

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摘要

Organic field-effect transistors based on poly{[N,N0-bis(2-octyldodecyl)- naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,50-(2,20-bithiophene)}, [P(NDI2OD-T2)n], were fabricated and characterized. The effect of octadecyltrichlorosilane (OTS) a self-assembled monolayer (SAM) grafted on to a SiO2 gate dielectric was investigated. A significant improvement of the charge mobility (mu), up to 0.22 cm(2)/V s, was reached thanks to the OTS treatment. Modifying some technological parameters relating to fabrication, such as solvents, was also studied. We have analyzed the electrical properties of these thin-film transistors by using a two-dimensional drift-diffusion simulator, Integrated System Engineering-Technology Computer Aided Design (ISE-TCAD(A (R))). We studied the fixed surface charges at the organic semiconductor/oxide interface and the bulk traps effect. The dependence of the threshold voltage on the density and energy level of the trap states has also been considered. We finally found a good agreement between the output and transfer characteristics for experimental and simulated data.
机译:基于聚{[n,N0-双(2-八羟二癸基) - 萘-1,4,5,8-双(二​​羧酰亚胺)-2,6-二基] -5-50-(制造和表征2,20-二硫乙烯)},[P(ndi2od-t2)n]。研究了八氯基三氯硅烷(OTS)接枝到SiO2栅极电介质的自组装单层(SAM)的作用。由于OTS处理,达到了电荷迁移率(MU),达到0.22cm(2)/ V S的显着改善。还研究了修改与制造有关的技术参数,例如溶剂。我们通过使用二维漂移扩散模拟器,集成系统工程技术计算机辅助设计(ISE-TCAD(A(R)))分析了这些薄膜晶体管的电特性。我们研究了有机半导体/氧化物界面处的固定表面电荷和散装陷阱效果。还考虑了阈值电压对陷阱状态的密度和能级的依赖性。我们终于找到了实验和模拟数据的输出和传递特性之间的良好一致性。

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