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首页> 外文期刊>Journal of Electronic Materials >Effects of Multiple Stacking Faults on the Electronic and Optical Properties of Armchair MoS2 Nanoribbons: First- Principles Calculations
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Effects of Multiple Stacking Faults on the Electronic and Optical Properties of Armchair MoS2 Nanoribbons: First- Principles Calculations

机译:多堆垛机故障对扶手椅MOS2纳米电子和光学特性的影响:第一原理计算

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摘要

The electronic and optical properties of armchair MoS2 nanoribbons with multiple stacking faults are investigated using first-principles calculations. It's interesting that the band gaps approach zero for armchair MoS2 nanoribbons with two and four stacking faults. The gaps of armchair MoS2 nanoribbons with one stacking fault and three stacking faults are converged to 0.46 eV and 0.36 eV, respectively, which is smaller than perfect MoS2 nanoribbons. The partial charge density of armchair MoS2 nanoribbons with two stacking faults shows that the defect levels are originated from stacking faults. The frequency-dependent optical response (dielectric function, absorption, reflectance and electron energy loss spectra) is also presented. The optical results of monolayer MoS2 are in agreement with previous study. The peaks in the imaginary part of perfect armchair MoS2 nanoribbons are about 2.8 eV, 4.0 eV and 5.4 eV and the peaks of the imaginary part of armchair MoS2 nanoribbons with stacking faults are mainly 2.8 eV and 5.4 eV. They are independent of ribbon width. The peaks in electron energy loss spectra move toward larger wavelengths (redshift) due to the introduction of stacking faults.
机译:使用初始原则计算研究了具有多个堆叠故障的扶手椅MOS2纳米杆的电子和光学性质。有趣的是,带空隙差距为扶手椅MOS2纳米波堡的零点和四个堆叠故障。具有一个堆叠故障的扶手椅MOS2纳米隙和三个堆叠故障的差距分别融合到0.46eV和0.36eV​​,其小于完美的MOS2纳米波巴。具有两个堆叠故障的扶手椅MOS2纳米的部分充电密度表明缺陷水平源于堆叠故障。还呈现了频率依赖性光学响应(介电函数,吸收,反射和电子能损谱)。单层MOS2的光学结果与先前的研究一致。完美扶手椅MOS2纳米波巴的虚部中的峰值约为2.8eV,4.0eV和5.4 EV以及带堆叠故障的扶手椅MOS2纳米纳米峰的峰值主要是2.8eV和5.4eV。它们与色带宽度无关。由于引入堆叠故障,电子能量损失光谱中的峰值朝向更大的波长(红移)。

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