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首页> 外文期刊>Journal of Electronic Materials >Process Optimization of Passive Matrix GaN-Based Micro-LED Arrays for Display Applications
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Process Optimization of Passive Matrix GaN-Based Micro-LED Arrays for Display Applications

机译:用于显示应用的无源矩阵GaN的微LED阵列的过程优化

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Passive matrix GaN-based micro light-emitting diode (LED) arrays with two resolutions of 32x32 and 128x64 are designed and fabricated, and a micro control unit is used to drive the devices and display Chinese characters. The process of the micro-LED display arrays is systematically optimized, where emphasis has been put on solving two specific technical problems. First, the deep isolation trench is etched in two steps in order to decrease the slope of the isolation trench so as to ease the p electrode to climb. In this way, the otherwise easily broken p metal line is now very reliable. Second, a secondary growth method is employed to deposit SiO2 onto the n metal line as an insulation layer between the p and n electrode layers. Between the two deposition steps, the chips are rotated with a certain angle. Therefore, the probability of pinhole overlap is significantly reduced, and the insulation between the p and n electrode layers is guaranteed. Using the optimized micro-LED process, micro displays are fabricated and their electrical, optical, and thermal characteristics for two different pixel sizes are analyzed. Experiments show that the process optimization above helps realize the outstanding properties of the micro-LED display arrays, increase the device and system reliability. The work will contribute to the implementation of the GaN based micro-LED technologies in real life.
机译:设计和制造具有两个分辨率的基于无源矩阵GaN的微发光二极管(LED)阵列,并制造了微量控制单元来驱动设备并显示汉字。系统地优化了微LED显示屏阵列的过程,其中强调解决了两个特定的技术问题。首先,以两个步骤蚀刻深隔离沟槽,以减小隔离沟槽的斜率,以便使P电极升高。通过这种方式,否则容易破碎的P金属线现在非常可靠。其次,使用二次生长方法将SiO 2沉积到N金属线上作为P和N电极层之间的绝缘层。在两个沉积步骤之间,芯片以一定的角度旋转。因此,针孔重叠的概率显着降低,并且保证了P和N电极层之间的绝缘。使用优化的微LED工艺,分析了微显示器,分析了它们的电气,光学,光学,光学和热特性,用于两种不同像素尺寸。实验表明,上述过程优化有助于实现微LED显示屏阵列的出色特性,提高器件和系统可靠性。该工作将有助于实施现实生活中的GaN基微LED技术。

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