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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Abrupt conversion of the conductivity and band-gap in the sputter grown Ga-doped ZnO films by a change in growth ambient: Effects of oxygen partial pressure
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Abrupt conversion of the conductivity and band-gap in the sputter grown Ga-doped ZnO films by a change in growth ambient: Effects of oxygen partial pressure

机译:突然转化溅射种植Ga掺杂的ZnO膜中的电导率和带间隙通过生长环境的变化:氧分压的影响

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摘要

GZO films were sputter grown under the different O-2/Ar + O-2 ratios and the systematic investigation has been tried in an effort to get a better understanding on the correlations between the involved defects and the film properties. The abrupt conversion of the resistivity was observed from the highly conductive, 2.52. 10(-4) Omega cm, at pure Ar ambient to resistive, 0.295 Omega cm, with an oxygen addition of 1% in the ambient, accompanying the significant reduction in the electron density and mobility. Hall measurement at 10 K-300 K and in-depth XPS analysis suggested that the higher Hall mobility and carrier density in the film grown in pure Ar ambient may be due to a lower compensation ratio and the compensation via Gazn-Vzn complexes may play a major role in the sudden reduction in the electron density and the reduced density of the Ga-zn, substitutional donors induced by oxygen addition in growth ambient. (c) 2018 Elsevier B.V. All rights reserved.
机译:GZO薄膜在不同的O-2 / AR + O-2比率下溅射生长,并努力实现系统调查,以便更好地了解所涉及的缺陷与薄膜性质之间的相关性。 从高导电,2.52开始观察到电阻率的突然转化。 10(-4)欧米茄CM,在纯AR环境下抗电阻,0.295Ω厘米,环境温度下的氧气加入1%,伴随着电子密度和移动性的显着降低。 霍尔测量在10 k-300k和深入的XPS分析中,表明纯AR环境中生长的薄膜中的高霍尔迁移率和载体密度可以是由于较低的补偿率和通过Gazn-VZN复合物的补偿可能发挥作用 在突然减小电子密度和Ga-Zn的密度降低的主要作用,增生环境中的氧气添加诱导的替代供体。 (c)2018年elestvier b.v.保留所有权利。

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