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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Ultra-wide-bandgap (ScGa)(2)O-3 alloy thin films and related sensitive and fast responding solar-blind photodetectors
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Ultra-wide-bandgap (ScGa)(2)O-3 alloy thin films and related sensitive and fast responding solar-blind photodetectors

机译:超宽带隙(SCGA)(2)O-3合金薄膜及相关敏感和快速响应太阳盲光电探测器

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Although beta-Ga2O3 is considered an excellent candidate for solar-blind photodetectors (PDs) owing to its direct bandgap (4.9 eV) and high stability, the cut-off wavelength often oversteps the DUV region, reducing the rejection ratio of the PD. Moreover, oxygen vacancies, which always appear in beta-Ga2O3 films, act as trap centers hindering carrier recombination and significantly lowering response speed. To disentangle these issues, we propose in this work to modify beta-Ga2O3 by incorporating Sc to form ternary (ScGa)(2)O-3 alloys. Thanks to the wider bandgap of Sc2O3 (-5.7 eV) than Ga2O3 and stronger Sc-O bonding than Ga-O, the (ScGa)(2)O-3 alloy films exhibit a wider bandgap (5.17 eV) with fewer oxygen vacancies compared with pure-Ga2O3, as expected, which eventually lead to an ultra-low dark current (0.08 pA at 10 V) and faster response times (tau(rise): 41/149 ms; tau(decay): 22/153 ms) of the alloy film-based PDs. Furthermore, the peak and cut-off response wavelengths of the (ScGa)(2)O-3 PD are blue shifted relative to the pure Ga2O3 PD, resulting in a higher rejection ratio (>500 vs -317). The Sc-alloying strategy, taking advantage of wider bandgap of Sc2O3 and stronger Sc-O bonding to widen the bandgap while reducing the intrinsic carriers and oxygen vacancies in the (ScGa)(2)O-3 alloy, is expected to be generally applicable to the design of other wide-bandgap oxide alloys for developing high-performance UV photodetectors with a low dark current and high response speed. (C) 2020 Elsevier B.V. All rights reserved.
机译:尽管β-Ga2O3被认为是太阳盲光电探测器(PDS)的优异候选者,但由于其直接带隙(4.9eV)和高稳定性,截止波长通常会超越DUV区域,降低PD的抑制比。此外,含氧空缺,总是出现在Beta-Ga2O3薄膜中,充当陷阱中心阻碍载体重组和显着降低响应速度。要解开这些问题,我们提出了通过将SC掺入三元(SCGA)(2)O-3合金来修改Beta-Ga2O3。由于SC2O3(-5.7eV)的更宽的带隙而不是GA2O3和比GA-O更强的SC-O键合,而(SCGA)(2)O-3合金薄膜表现出更宽的带隙(5.17eV),相比具有更少的氧空缺如预期的预期,纯Ga2O3最终导致超低暗暗电流(0.08 pa,0.08 pA)和更快的响应时间(Tau(上升):41/149毫秒; tau(衰退):22/153 ms)基于合金膜的PD。此外,(SCGA)(2)O-3 Pd的峰值和切断响应波长是相对于纯GA2O3 PD的蓝色移位,导致更高的抑制比(> 500Vs -317)。利用SC2O3的更宽的带隙和更强大的SC-O键合来扩大带隙的SC合金策略,同时降低(SCGA)(2)O-3合金中的内在载体和氧空位,预计通常适用用于设计具有低暗电流和高响应速度的高性能UV光电探测器的其他宽带凝胶合金。 (c)2020 Elsevier B.v.保留所有权利。

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