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Hard titanium nitride coating deposition inside narrow tubes using pulsed DC PECVD processes

机译:使用脉冲DC PECVD工艺在窄管内硬钛氮化钛涂层沉积

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摘要

In the present work, we reviewed and studied the fabrication process of hard erosion resistant TiN protective coatings on the inner surfaces of narrow tubes using a Non-Line-Of-Sight (NLOS) approach. Initially, while evaluating the growth of DLC and TiN by the CW RF PECVD process, we found that the use of a hydrocarbon precursor to obtain DLC provides uniform film thickness along the tube axis, while the use of the TiCl4 precursor for TiN leads to a significant thickness nonuniformity of 80% and large differences between the film properties in the middle of the tube compared to the edges. Following detailed plasma analysis, we demonstrate that the uniformity can be substantially enhanced by applying pulsed-DC PECVD, while uniform (better than 20%) hard TiN films were prepared by low-frequency (5 kHz) pulsed-DC PECVD. The TiN films (about 12 mu m thick), systematically studied by SEM, XRD, and nanoindentation, when prepared under optimized conditions, exhibit high hardness and reduced Young's modulus (25 and 225 GPa, respectively) corresponding to the (111) preferred crystallographic orientation, and a very low Cl contamination (< 3%). The film uniformity has been correlated to that of the discharge light emission intensity along the tube axis, and the microstructural evolution is interpreted in terms of surface densification due to substrate temperature and ion bombardment of the inner surface. The pulsed DC PECVD NLOS process providing TiN coatings with a hardness markedly higher than the hardness of the erodent particles and with a solid particle erosion resistance increased by a factor of > 15 compared to the bare substrate is well suited for the protection of aerospace, manufacturing, and other critical components with a complex shape of inner surfaces.
机译:在目前的工作中,我们使用非视线(NLOS)方法在窄管内表面上进行了审查和研究了硬侵蚀抗锡保护涂层的制造过程。最初,在评估DLC和锡的生长通过CW RF PECVD工艺时,我们发现使用烃前体获得DLC沿管轴线提供均匀的膜厚度,同时使用TiCl4前体用于锡导线与边缘相比,在管中间的膜特性之间的显着厚度不均匀且差异大。在详细的等离子体分析之后,我们证明通过施加脉冲DC PECVD可以基本上增强均匀性,而通过低频(5kHz)脉冲-DC PECVD制备均匀(优于20%)硬锡膜。通过SEM,XRD和纳米温度进行系统研究的锡膜(约12μm厚),当在优化条件下制备时,表现出高硬度和减少的杨氏模量(分别减少)对应于(111)优选的晶体取向,以及非常低的Cl污染(<3%)。薄膜均匀性与沿管轴的放电发光强度的相关性相关,并且在表面致密化引起的基板温度和内表面的离子轰击的方面被解释了微结构演变。脉冲DC PECVD NLOS工艺提供具有明显高于腐蚀颗粒的硬度的锡涂层,并且与裸衬底相比,具有高于蚀刻颗粒的硬度和固体颗粒腐蚀性的耐粒子侵蚀阻力,非常适合保护航空航天,制造以及具有复杂的内表面形状的其他关键部件。

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