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A DFT/B3LYP Investigation of Sulfur Doping at 6.25% on ZnO Material

机译:ZnO材料上6.25%的硫掺杂的DFT / B3LYP研究

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ZnO is a semiconductor material largely employed in the development of electronic and optical devices, as well as photocatalytic processes due to its single electronic property. Calculations based on DFT/B3LYP were performed to evaluate the electronic, optical and structural properties of S-doped ZnO material at 6.25 %. The theoretical results indicate the improvement of electronic and optical properties by decreasing the band-gap which caused by contribution of S atoms to Valence Band from energetic levels higher than O atoms. Such band-gap decrease allied to the direct conduction process expected to doped materials suggests the S-doped ZnO material as a viable alternative to application in the development of electro-optical devices to be applied in photocatalytic process. Structural results show that the doping process has low effect on lattice parameters of the ZnO material indicating that the compatibility between the doped ZnO material and the Si substrate is not changed.
机译:ZnO是一种半导体材料,由于其单一的电子特性而广泛用于电子和光学设备以及光催化工艺的开发中。进行了基于DFT / B3LYP的计算,以评估S掺杂ZnO材料的电子,光学和结构性能为6.25%。理论结果表明,通过降低由S原子比O原子更高的能级对S价带的贡献所引起的能带隙,可以改善电子和光学性能。与预期的掺杂材料的直接传导过程相关的这种带隙减小表明,S掺杂的ZnO材料可以替代在光催化过程中应用的电光器件开发中的应用。结构结果表明,掺杂工艺对ZnO材料的晶格参数影响很小,表明掺杂的ZnO材料与Si衬底之间的相容性没有改变。

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