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首页> 外文期刊>The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical >Accurate Estimation of Membrane Capacitance from Atomistic Molecular Dynamics Simulations of Zwitterionic Lipid Bilayers
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Accurate Estimation of Membrane Capacitance from Atomistic Molecular Dynamics Simulations of Zwitterionic Lipid Bilayers

机译:两性离子脂双层原子分子动力学模拟膜电容的精确估计

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摘要

Lipid membranes are indispensable to life, and they regulate countless cellular processes. To investigate the properties of membranes under controlled conditions, numerous reconstitution methods have been developed over the last few decades. Several of these methods result in the formation of lipid bilayers containing residual hydrophobic molecules between the two monolayers. These contaminants might alter membrane properties, including bilayer thickness, that is usually inferred from measurements of membrane capacitance assuming a simple slab model. However, recent measurements on solvent-free bilayers raised significant questions on the reliability of this approach. To reconcile the observed discrepancies, we developed a protocol to predict membrane capacitance from the dielectric profile of lipid bilayers computed from molecular dynamics simulations. Our methodology shows excellent agreement against available data on solvent-free noncharged bilayers, and it confirms that the uniform slab model is a reliable approximation from which to infer membrane capacitance. We find that the effective electrical thickness contributing to membrane capacitance is different from the hydrophobic thickness inferred from X-ray scattering form factors. We apply our model to estimate the concentration of residual solvent in reconstituted systems, and we propose that our protocol could be used to infer membrane properties in the presence of hydrophobic solvents.
机译:脂质膜对寿命不可或缺,并且它们调节无数细胞过程。为了研究受控条件下膜的性质,在过去几十年中已经开发了许多重构方法。这些方法中的几种导致含有两种单层之间的残留疏水分子的脂质双层的形成。这些污染物可能会改变膜性质,包括双层厚度,这通常是假设简单的板式模型的膜电容的测量推断。然而,最近对无溶剂双层的测量提出了关于这种方法可靠性的重要问题。为了调和观察到的差异,我们开发了一种协议,以预测来自来自分子动力学模拟的脂质双层的介电轮廓的膜电容。我们的方法显示出对无溶剂的非充电双层的可用数据的良好一致性,并且它证实均匀的板坯模型是从中推断膜电容的可靠近似。我们发现,有效的电厚度与膜电容的有效电厚度不同于从X射线散射形式因子推断的疏水厚度不同。我们应用我们的模型来估计重构系统中残留溶剂的浓度,并提出我们的方案可用于在疏水溶剂存在下推断膜性质。

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