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首页> 外文期刊>Physica, B. Condensed Matter >Thermally excited quantum dot and energy transfer in thin films
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Thermally excited quantum dot and energy transfer in thin films

机译:薄膜的热激发量子点和能量转移

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Thermal transfer inside thin films with quantum-dot is considered. The Boltzmann equation is used to model the energy transport within the film when the quantum dot is thermally disturbed. Equivalent equilibrium temperature is introduced to evaluate the phonon intensity distribution inside the films. Time exponentially increasing temperature is incorporated inside the quantum dot to resemble the thermal disturbance inside the films. The wave dependent equation of phonon energy distribution is accommodated for the formulation of thermal transfer in the silicon and diamond thin films. A numerical code developed is validated through comparison of the thermal conductivity predicted and that obtained from the previous work. The findings show that film thermal conductivity data predicted is in good agreement with those reported in the previous study. Phonon intensity and temperature becomes high in the film around the quantum. Long wavelength phonons enhance phonon intensity distribution in the near region of the film edges; however, boundary scattering causes temperature jump in this region.
机译:考虑使用量子点的薄膜内部薄膜。当量子点热干扰时,Boltzmann等式用于模拟膜内的能量传输。引入了等效的平衡温度以评估薄膜内的声子强度分布。在量子点内掺入了时间指数增加的温度,以类似于薄膜内的热扰动。位于硅和金刚石薄膜中的热传递的制剂的波形依赖性方程被容纳在配方中。通过比较预测的导热率和从上一项工作获得的比较来验证开发的数值代码。该研究结果表明,预测的薄膜导热性数据与先前研究中报道的那些吻合良好。在量子周围的膜中,声子强度和温度变高。长波长声子增强薄膜边缘近区域的声子强度分布;然而,边界散射导致该区域的温度跳跃。

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