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Towards replacing resistance thermometry with photonic thermometry

机译:用光子温度计替换电阻温度

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Highlights?We present uncertainty analysis of a packaged photonic thermometer.?Photonic sensors with Q's of 104 are sufficient for temperature measurements with uncertainties of ?40 mK?Long-term drift limits packaged photonic thermometers uncertainty to 175?mK.AbstractResistance thermometry provides a time-tested method for taking temperature measurements that has been painstakingly developed over the last century. However, fundamental limits to resistance-based approaches along with a desire to reduce the cost of sensor ownership and increase sensor stability has produced considerable interest in developing photonic temperature sensors. Here we demonstrate that silicon photonic crystal cavity-based thermometers can measure temperature with uncertainities of 175?mK (k?=?1), where uncertainties are dominated by ageing effects originating from the hysteresis in the device packaging materials. Our results, a ≈4-fold improvement over recent developments, clearly demonstate the rapid pr
机译:<![cdata [ 突出显示 我们呈现了封装的光子温度计的不确定性分析。 使用Q的光子传感器104的光子传感器足以进行温度测量,以便与不确定性的温度测量mk 长期漂移限制包装的光子温度计不确定性至175?MK。 抽象 电阻测温仪提供了一种时间测试的方法,用于采用在上个世纪煞费苦地发展的温度测量。然而,基于抵抗的方法以及减少传感器所有权的成本和提高传感器稳定性的愿望在开发光子温度传感器方面产生了相当大的兴趣。在这里,我们证明基于硅光子晶体腔的温度计可以测量175Ω·MK( k =Δ1)的息型,其中不确定性是由磁滞的老化效果主导在器件包装材料中。我们的结果,对近期发展的改善,清楚地证明了快速公关

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