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首页> 外文期刊>Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic >Ultrahigh-sensitivity fiber Bragg grating refractive index sensor based on thin cladding and mode transition
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Ultrahigh-sensitivity fiber Bragg grating refractive index sensor based on thin cladding and mode transition

机译:基于薄包层和模式转换的超高灵敏度光纤布拉格光栅折射率传感器

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摘要

This paper presents an ultrahigh-sensitivity fiber Bragg grating (FBG) refractive index (RI) sensor, which combines the high sensitivity of mode transition (MT) and thin cladding FBG. According to the derivatives of the effective refractive index (ERIs) of different cladding modes versus overlay thickness when surrounding refractive index (SRI) is 1.33, we found the sensitivity to SRI increases as the order of cladding mode increases. The 21st cladding mode is selected for sensing, which has the strongest coupling with core mode. For the 21st cladding mode, we obtain the optimum overlay thickness (OOT) in MT under different cladding radii by calculating derivative of ERI versus overlay thickness, and we approve that the sensitivity to SRI increases as the overlay thickness approaches the OOT. In addition, as the cladding radius decreases, the OOT gradually decreases, and the sensitivity at the OOT gradually increases, but the detecting range decreases. We give the matching relationship between cladding radius and OOT, which is meaningful and given by y = 303-903*exp(-0.098*x), where y is OOT(nm), x is cladding radius(mu m). Then, we calculate the sensitivity to SRI under different cladding radii and matched OOTs. The results show the sensitivity to SRI is available to 1.115 x 10(5)pm/RIU, corresponding resolution is 8.97 x 10(-6)RIU, when the cladding radius is 14.4 mu m and the matched OOT is 84nm. Such a FBG SRI sensor is competitive with other FBG-based refractometers and the resolution is about two orders of magnitude higher than those FBG-based refractometers used for RI sensing around 1.33 with thin cladding or MT.
机译:本文介绍了超高灵敏度光纤布拉格光栅(FBG)折射率(RI)传感器,其结合了模式过渡(MT)和薄包层FBG的高灵敏度。根据不同包覆模式的有效折射率(ERIS)的衍生物,随着覆盖厚度时,周围折射率(SRI)是1.33,我们发现对SRI的敏感性随着包层模式的顺序而增加。选择21个包层以进行感测,其具有与核心模式最强的耦合。对于第21个包层模式,通过计算ERI与覆盖厚度的衍生物,我们在不同的包层下获得MT的最佳覆盖层厚度(OOT),并且我们赞同SRI的敏感性随着覆盖层厚度接近OOT而增加。另外,随着覆层半径减小,嘴酥液逐渐减小,并且斑块的灵敏度逐渐增加,但检测范围减小。我们给出了覆盖半径和OOT之间的匹配关系,这是一个有意义的,由Y = 303-903 * exp(-0.098 * x)给出,其中Y是oot(nm),x是包层半径(mu m)。然后,我们计算不同包层的半导体和匹配的OTS下对SRI的敏感性。结果表明,SRI的敏感性可用于1.115×10(5)PM / RIU,相应的分辨率为8.97×10( - 6)RIU,当包层半径为14.4μm,匹配的oot为84nm。这种FBG SRI传感器与其他基于FBG的折射计具有竞争力,并且该分辨率大约比具有薄包层或MT的RI感测的FBG的折射计高约两个数量级。

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