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Electrochemical synthesis of n-type ZnS layers on p-Cu2O/n-ZnO heterojunctions with different deposition temperatures

机译:具有不同沉积温度的P-Cu2O / N-ZnO杂交功能N型ZnS层的电化学合成

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摘要

Metal oxide p-n heterojunctions consisting of p-Cu2O/n-ZnO/n-ZnS nanostructures were deposited on an ITO substrate by three-step electrodeposition. The effect of ZnS layer deposition temperature on the properties of the heterojunction was investigated by different techniques. The Mott-Schottky analysis confirmed the n-type conductivity for ZnO and ZnS and p-type conductivity for the Cu2O layer, respectively. Also, it showed a decrease of ZnS donor concentration with increasing deposition temperature. The X-ray diffraction (XRD) analysis confirms a pure phase of hexagonal ZnO, cubic ZnS and cubic Cu2O structures, respectively. The heterojunction with ZnS deposited at 60 degrees C shows high crystallinity. The morphological measurements by scanning electron microscopy (SEM) indicate that the deposition temperature has a significant influence on the morphology of ZnO and the atomic force microscopy (AFM) images revealed the improvement of Cu2O morphology by increasing the ZnS deposition temperature. The UV-Vis response shows strong absorption in the visible region and the profile of optical absorption spectra changes with the ZnS deposition temperature. The current-voltage (I-V) characteristics of the Au/p-Cu2O/n-ZnO/n-ZnS/ITO heterojunction display well-defined rectifying behavior for the heterojunction with ZnS deposited at 60 degrees C.
机译:通过三步电沉积在ITO底物上沉积由P-Cu 2 O / N-ZnO / N-ZnS纳米结构组成的金属氧化物P-N杂疾病。通过不同的技术研究了ZnS层沉积温度对异质结的性能的影响。 Mott-Schottky分析分别证实了Cu2O层的ZnO和ZnS和P型导电性的n型导电性。而且,它表明ZnS供体浓度的降低随着沉积温度的增加而降低。 X射线衍射(XRD)分析分别证实了六方ZnO,立方ZnS和立方Cu2O结构的纯相。在60℃下沉积的ZnS的异质结显示出高结晶度。通过扫描电子显微镜(SEM)的形态学测量表明沉积温度对ZnO和原子力显微镜(AFM)图像的形态具有显着影响,通过增加ZnS沉积温度来揭示Cu2O形态的改善。 UV-Vis响应显示在可见区域中的强吸收和光学吸收光谱的轮廓随ZnS沉积温度而变化。 AU / P-CU2O / N-ZnO / N-ZnS / ITO异质结的电流 - 电压(I-V)特性为沉积在60摄氏度的ZnS的异质结来显示明确定义的整流行为。

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    《RSC Advances》 |2019年第50期|共14页
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  • 正文语种 eng
  • 中图分类 化学;
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